First-principles computation is used in an attempt to identify materials with low secondary electron yield for high power microwave devices used in space. Based on the relation between the maximum secondary electron yield and the work function of materials, it is suggested that materials with lower work function may have lower maximum secondary electron yield. Following this lead, the work functions of two kinds of composite structures, which are formed by the coverage of the graphene structure on Ni (111) and Pd (111) surfaces, are calculated, which show that the composite material has a work function that is substaintially lower than either of its two components. Such result indicates that the composite material may have low maximum secondary electron yield. This approach provides new ideas for selecting materials with low secondary electron yield.
WANG Xiaojie
,
WANG Dawei
,
LI Yongdong
,
CHANG Qunfeng
,
ZHANG Chuxian
. Low Secondary Electron Yield Materials for Space Microwave Devices Based on First Principles Computation[J]. Journal of Mechanical Engineering, 2018
, 54(9)
: 115
-120
.
DOI: 10.3901/JME.2018.09.115
[1] LUO J, TIAN P, PAN C T, et al. Ultralow secondary electron emission of graphene[J]. ACS nano, 2011, 5(2):1047-1055.
[2] PINTO P C, CALATRONI S, NEUPERT H, et al. Carbon coatings with low secondary electron yield[J]. Vacuum, 2013, 98:29-36.
[3] VALLGREN C Y, CALATRONI S, PINTO P C, et al. Characterization of carbon coatings with low secondary electron yield[J]. Vacuum, 2012, 98(4):29-36.
[4] MONTERO I, AGUILERA L, DAVILA M E, et al. Secondary electron emission under electron bombardment from graphene nanoplatelets[J]. Applied Surface Science, 2014, 291:74-77.
[5] RICCARDI P, CUPOLILLO A, PISARRA M, et al. Primary energy dependence of secondary electron emission from graphene adsorbed on Ni (111)[J]. Applied Physics Letters, 2012, 101(18):183102-1-183102-4.
[6] 刘学悫. 阴极电子学[M]. 北京:科学出版社, 1980. LIU Xueque. Cathode electronics[M]. Beijing:Science Press, 1980.
[7] LIN Y, JOY D C. A new examination of secondary electron yield data[J]. Surface and Interface Analysis, 2005, 37(11):895-900.
[8] BAROODY E M. A theory of secondary electron emission from metals[J]. Physical Review, 1950, 78(6):780-787.
[9] WIGNER E P, BARDEEN J. Theory of the work functions monovalent metals, Part I:Physical chemistry. Part Ⅱ:Solid state physics[M]. Berlin:Springer, 1997.
[10] GONZE X, BEUKEN J M, CARACAS R, et al. First-principles computation of material properties:the ABINIT software project[J]. Computational Materials Science, 2002, 25(3):478-492.
[11] GARRITY K F, BENNETT J W, RABE K M, et al. Pseudopotentials for high-throughput DFT calculations[J]. Computational Materials Science, 2014, 81:446-452.
[12] BLÖCHL P E. Projector augmented-wave method[J]. Physical Review B, 1994, 50(24):17953-17979.
[13] PERDEW J P, WANG Y. Accurate and simple analytic representation of the electron-gas correlation energy[J]. Physical Review B, 1992, 45(23):13244-13249.
[14] MONKHORST H J, PACK J D. Special points for Brillouin-zone integrations[J]. Physical Review B, 1976, 13(12):5188-5192.
[15] WHETTEN N R, LAPONSKY A B. Secondary electron emission of single crystals of MgO[J]. Journal of Applied Physics, 1957, 28(4):515-516.
[16] SEILER H. Secondary electron emission in the scanning electron microscope[J]. Journal of Applied Physics, 1983, 54(11):R1-R18.
[17] CIMINO A, PORTA P, VALIGI M. Dependence of the lattice parameter of magnesium oxide on crystallite size[J]. Journal of the American Ceramic Society, 1966, 49(3):152-156.
[18] OLIVER P M, WATSON G W, PARKER S C. Molecular-dynamics simulations of nickel oxide surfaces[J]. Physical Review B, 1995, 52(7):5323-5329.
[19] LIM J Y, OH J S, KO B D, et al. Work function of MgO single crystals from ion-induced secondary electron emission coefficient[J]. Journal of applied physics, 2003, 94(1):764-769.
[20] GREINER M T, HELANDER M G, WANG Z B, et al. Effects of processing conditions on the work function and energy-level alignment of NiO thin films[J]. The Journal of Physical Chemistry C, 2010, 114(46):19777-19781.
[21] KIM J H, HWANG J H, SUH J, et al. Work function engineering of single layer graphene by irradiationinduced defects[J]. Applied Physics Letters, 2013, 103(17):171604-1-171604-5.
