Color Difference Detection of Polycrystalline Wafers Based on Multi-component Convolution Neural Network

doi:10.3969/j.issn.1004-132X.2021.03.007

GUO Baosu；ZHUANG Jichao；ZHANG Qin；WU Fenghe

China Mechanical Engineering ›› 2021, Vol. 32 ›› Issue (03) : 297-304.

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China Mechanical Engineering ›› 2021, Vol. 32 ›› Issue (03) : 297-304. DOI: 10.3969/j.issn.1004-132X.2021.03.007

Color Difference Detection of Polycrystalline Wafers Based on Multi-component Convolution Neural Network

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2021, 32(03): 297-304 https://doi.org/10.3969/j.issn.1004-132X.2021.03.007

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Received	Published
2020-01-13	2021-02-10
Just Accepted Date	Issue Date
2021-02-07	2021-02-07

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