#br#
Wafer Acceptance Test Key Parameter Identification Based on Hybrid Feature Selection Method

doi:10.3969/j.issn.1004-132X.2020.16.010

#br# Wafer Acceptance Test Key Parameter Identification Based on Hybrid Feature Selection Method

LYU Youlong;XU Hongwei;ZHENG Cheng;ZHANG Jie;ZHENG Peng

China Mechanical Engineering ›› 2020, Vol. 31 ›› Issue (16) : 1978-1984,1997.

PDF(886 KB)

China Mechanical Engineering ›› 2020, Vol. 31 ›› Issue (16) : 1978-1984,1997. DOI: 10.3969/j.issn.1004-132X.2020.16.010

#br# Wafer Acceptance Test Key Parameter Identification Based on Hybrid Feature Selection Method

{{article.zuoZhe_EN}}

Author information +

History +

HeighLight

Abstract

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations

{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2020, 31(16): 1978-1984,1997 https://doi.org/10.3969/j.issn.1004-132X.2020.16.010

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

Funding

RIGHTS & PERMISSIONS

PDF(886 KB)

Accesses

Citation

Detail

Sections

Recommended

Published
2020-08-25
Just Accepted Date	Issue Date
2020-09-17	2020-09-17

Please choose a citation manager

Content to export