研究论文

Sn3.0Ag0.5Cu/Cu回流焊点界面化合物尺寸分布特征及生长机制

  • 杨林梅 ,
  • 牟国琬
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  • 沈阳工业大学, 沈阳, 110870
杨林梅,博士;主要从事电子封装焊点可靠性方面的科研工作;Email: linmeiyang@126.com

收稿日期: 2021-09-15

  网络出版日期: 2022-07-14

基金资助

国家自然科学基金资助项目(11604222)

Size distribution and growth mechanism of interfacial intermetallic compounds in Sn3.0Ag0.5Cu/Cu reflow solder joints

  • YANG Linmei ,
  • MU Guowan
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  • Shenyang University of Technology, Shenyang, 110870, China

Received date: 2021-09-15

  Online published: 2022-07-14

摘要

在电子封装过程中,钎料与基体之间形成金属间化合物层,其主要成分为Cu6Sn5,Cu6Sn5晶粒的尺寸和形貌特征能够显著影响焊点的服役性能. 采用回流焊的方法制备了一系列Sn3.0Ag0.5Cu/Cu焊点,使用Image-Pro Plus软件对焊接界面化合物Cu6Sn5晶粒的尺寸分布和化合物层的厚度进行了统计分析. 结果表明,Cu6Sn5的平均粒径正比于t0.38(t为回流时间), 界面化合物层的平均厚度正比于t0.32. 随着回流时间的增加,界面化合物生长速度变慢,Cu6Sn5晶粒的尺寸分布更加均匀. 回流时间较长的样品中Cu6Sn5的粒径尺寸分布与FRD模型的理论曲线基本相符,而对于回流时间短的样品,晶粒尺寸分布与FRD理论偏离较大. 统计结果显示,出现频次最高的晶粒尺寸小于平均值. 最后讨论了界面Cu6Sn5晶粒的生长机制,分析了回流时间对界面Cu6Sn5晶粒生长方式的影响.

本文引用格式

杨林梅 , 牟国琬 . Sn3.0Ag0.5Cu/Cu回流焊点界面化合物尺寸分布特征及生长机制[J]. 焊接学报, 2022 , 43(4) : 61 -67 . DOI: 10.12073/j.hjxb.20210915001

Abstract

In the process of electronic packaging, an intermetallic compounds layer is formed at the interface between solder and Cu substrate. The intermetallic compounds layer is mainly composed of Cu6Sn5 compounds. The size and morphology of the Cu6Sn5 intermetallic compounds have a notable influence on the reliability of solder joints. A series of Sn3.0Ag0.5Cu/Cu solder joints were prepared by reflow soldering method. Image-Pro Plus software was used to statistically analyze the size distribution and the thickness of the Cu6Sn5 grains. The results show that the average diameter of Cu6Sn5 grains is proportional to t0.38,where t is the reflow time. The mean thickness of the interfacial compounds layer is proportional to t0.32. With the increase of reflow time, the growth rate of interfacial compound slows down, and Cu6Sn5 grain size distribution becomes more uniform. The size distribution of Cu6Sn5 in samples with long reflow time is basically consistent with the theoretical curve of FRD model, while for samples with short reflow time, the grain size distribution deviates from the FRD theory. The statistical results show that the grain size with the highest frequency is less than the average value. The growth mechanism of interfacial Cu6Sn5 grains was discussed, and the effect of reflow time on the growth way of Cu6Sn5 grains was analyzed.

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