Analysis of efficiency of EMAT surface wave transducer based on bias magnetic field

ZHANG Yitao, CHENG Shuyun, LU Minghui, ZHU Ying, HU Ke, DAI Yuhui

Nondestructive Testing ›› 2023, Vol. 45 ›› Issue (11) : 59-66.

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Nondestructive Testing ›› 2023, Vol. 45 ›› Issue (11) : 59-66. DOI: 10.11973/wsjc202311012

Analysis of efficiency of EMAT surface wave transducer based on bias magnetic field

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 45(11): 59-66 https://doi.org/10.11973/wsjc202311012

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