Defect identification and quantitative analysis method based on improved YOLO V5

LIU Yang, LI Quanyong, GU Jian, YANG Fan, WANG Wenbo

Nondestructive Testing ›› 2023, Vol. 45 ›› Issue (1) : 14-19,22.

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Nondestructive Testing ›› 2023, Vol. 45 ›› Issue (1) : 14-19,22. DOI: 10.11973/wsjc202301003

Defect identification and quantitative analysis method based on improved YOLO V5

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 45(1): 14-19,22 https://doi.org/10.11973/wsjc202301003

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