Progress of Infrared Testing Technology

SHEN Gongtian, WANG Zunxiang

Nondestructive Testing ›› 2020, Vol. 42 ›› Issue (4) : 1-9,14.

PDF(2576 KB)
PDF(2576 KB)
Nondestructive Testing ›› 2020, Vol. 42 ›› Issue (4) : 1-9,14. DOI: 10.11973/wsjc202004001

Progress of Infrared Testing Technology

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2020, 42(4): 1-9,14 https://doi.org/10.11973/wsjc202004001

References

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(2576 KB)

Accesses

Citation

Detail

Sections
Recommended

/