The Defect Image Enhancement Based on Multi-scale Retinex

SUN Bin, BU Xiongzhu, WANG Zhengcheng, GAO Minjie

Nondestructive Testing ›› 2017, Vol. 39 ›› Issue (6) : 24-27.

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Nondestructive Testing ›› 2017, Vol. 39 ›› Issue (6) : 24-27. DOI: 10.11973/wsjc201706005

The Defect Image Enhancement Based on Multi-scale Retinex

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2017, 39(6): 24-27 https://doi.org/10.11973/wsjc201706005

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