Ion thinning method for simultaneous preparation of multiple TEM cross-section samples

ZHANG Ge, CUI Yun, ZHAO Jiaoling, WANG Tao, ZHAO Yuan

Physical Testing and Chemical Analysis Part A:Physical Testing ›› 2023, Vol. 59 ›› Issue (10) : 27-29,33.

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Physical Testing and Chemical Analysis Part A:Physical Testing ›› 2023, Vol. 59 ›› Issue (10) : 27-29,33. DOI: 10.11973/lhjy-wl202310006
Test Technique and Method

Ion thinning method for simultaneous preparation of multiple TEM cross-section samples

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 59(10): 27-29,33 https://doi.org/10.11973/lhjy-wl202310006

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