A method for quartz glass planar transmission electron microscope sample preparation based on focus ion beam

LI Yixue, DING Ying, ZHANG Guodong, GAO Qianwen, SHI Xuefang, LIU Feng

Physical Testing and Chemical Analysis Part A:Physical Testing ›› 2023, Vol. 59 ›› Issue (1) : 27-30.

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Physical Testing and Chemical Analysis Part A:Physical Testing ›› 2023, Vol. 59 ›› Issue (1) : 27-30. DOI: 10.11973/lhjy-wl202301008
Test Technique and Method

A method for quartz glass planar transmission electron microscope sample preparation based on focus ion beam

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 59(1): 27-30 https://doi.org/10.11973/lhjy-wl202301008

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