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ISSN 1674-5949 CN 31-2023/U
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中文
Reliability in Electronic Packaging: Past, Now and Future
CHEN Zhiwen, MEI Yunhui, LIU Sheng, LI Hui, LIU Li, LEI Xiang, ZHOU Ying, GAO Xiang
Journal of Mechanical Engineering . 2021, (
16
): 248 -268 . DOI: 10.3901/JME.2021.16.248
