High-Resolution Characterization of Microstructural Damage inMaterials by Synchrotron Radiation Source 4D In-situ Tomography

WU Shengchuan, WU Zhengkai, HU Yanan, BAO Jianguang, LI Fei, XIAO Tiqiao, YUAN Qingxi

Materials For Mechanical Engineering ›› 2020, Vol. 44 ›› Issue (6) : 72-76.

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Materials For Mechanical Engineering ›› 2020, Vol. 44 ›› Issue (6) : 72-76. DOI: 10.11973/jxgccl202006016

High-Resolution Characterization of Microstructural Damage inMaterials by Synchrotron Radiation Source 4D In-situ Tomography

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2020, 44(6): 72-76 https://doi.org/10.11973/jxgccl202006016

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